分析部門（すずかけ台）｜装置一覧

Organic Element Analyzers

・CHN simultaneous measurement device (J-SCIENCE JM10,JM11) ・O measuring device (Elementar Vario micro cube) ・Halogen,S measurement device (Yanaco HSU-20,Thermo ICS-1100) ・Ultra-Micro Balance ・Micro Balance

Inorganic Element Analyzers

Mass Spectrometer

・ESI-TOF-MS (Bruker micrOTOFⅡ)
・MALDI-TOF-MS (Bruker UltrafreXtreme)
・Double-focusing MS <GC付属>

Structural Analysis Device

・Automated Multipurpose X‑ray Diffractometer（Rigaku SmartLab）
・Multipurpose X-ray Diffraction System (Rigaku Ultima Ⅳ)
・XRD and DSC simultaneous measurement device（Rigaku XRD-DSC）

Electronic Microscope

・Field Emission Electron Microscope（JEOL FE-TEM,JEM-2100F）
・Transmission Electron Microscope (JEOL TEM,JEM-1400)
・MultiBeam FIB-SEM (JIOL FIB-SEM,JIB-4500)
・Field Emission Scanning Electron Microscope (Hitachi High-Tech FE-SEM,S-5500)
・Field Emission Scanning Electron Microscope (JIOL FE-SEM,JSM-IT800)
・Scanning Electron Microscope (JIOL SEM,JSM-6610LA)
・Scanning Electron Microscope (JIOL JSM-IT100)
・Ultramicrotome (Leica UC6/FC6)
・Electron microscope pretreatment group

Thermal Analyzer

・Simultaneous Thermogravimetry / Differential Thermal Analysis (SHIMAZU TG-DTA,DTG-60)
・TG-DTA / Photoionization Mass Spectrometer Simultaneous Measurement System (Rigaku ThermoMass Photo)

Others

・SEC／Light Scattering System
・時間分解吸収分光解析システム (浜松ホトニクス TRASAS)【故障のため利用停止】
・Spectroscopic Ellipsometer (JASCO ELC-300)